“JESD22-C101F: Field-Induced Charged-Device Model Test Method for Electrostatic Discharge Withstand Thresholds of Microelectronic Components.” JEDEC ...
JESD22-C101F, Oct 2013. The material in this test method has been superseded by JS-002-2018, published January 2019, which in turn has been superseded by JS ...
This annex briefly describes most of the changes made to entries that appear in this standard,. JESD22-C101F, compared to its predecessor, JESD22-C101E ( ...