TinyButStrong Error in field [var.media_title...]: the key 'media_title' does not exist or is not set in VarRef. (VarRef seems refers to $GLOBALS) This message can be cancelled using parameter 'noerr'.
TinyButStrong Error in field [var.media_title...]: the key 'media_title' does not exist or is not set in VarRef. (VarRef seems refers to $GLOBALS) This message can be cancelled using parameter 'noerr'.
TinyButStrong Error in field [var.media_title...]: the key 'media_title' does not exist or is not set in VarRef. (VarRef seems refers to $GLOBALS) This message can be cancelled using parameter 'noerr'.
TinyButStrong Error in field [var.media_title...]: the key 'media_title' does not exist or is not set in VarRef. (VarRef seems refers to $GLOBALS) This message can be cancelled using parameter 'noerr'.
TinyButStrong Error in field [var.media_title...]: the key 'media_title' does not exist or is not set in VarRef. (VarRef seems refers to $GLOBALS) This message can be cancelled using parameter 'noerr'.
TinyButStrong Error in field [var.media_title...]: the key 'media_title' does not exist or is not set in VarRef. (VarRef seems refers to $GLOBALS) This message can be cancelled using parameter 'noerr'.
TinyButStrong Error in field [var.media_desc...]: the key 'media_desc' does not exist or is not set in VarRef. (VarRef seems refers to $GLOBALS) This message can be cancelled using parameter 'noerr'.
TinyButStrong Error in field [var.media_url...]: the key 'media_url' does not exist or is not set in VarRef. (VarRef seems refers to $GLOBALS) This message can be cancelled using parameter 'noerr'. [var.media_title;onformat=retitle] :: 哇哇3C日誌
Charged device model (CDM) ESD is considered to be the primary real-world ESD model for representing ESD charging and rapid discharge and is the best ...
由 LG Henry 著作 · 被引用 16 次 — CDM testing consists of charging the DUT to a given voltage, discharging it through the 1.0 Ω current viewing resistor to gound, while monitoring the discharge, ...
The Charged Device Model (CDM) is the ESD model which best simulates real time integrated circuit ESD threats. For example, this model covers the situation ...
2024年2月15日 — Introduction. The charged device model (CDM) electrostatic discharge (ESD) testing is useful in recreating the potentially destructive discharge ...
Next Generation Charged Device Model ESD Testing. The charged device model (CDM) describes the electrostatic discharge (ESD) event that occurs when an.
2023年8月15日 — CDM results from charge on the device package, circuit board, or nearby object. The result of this charge is a voltage induced on the pins of ...
IC design for performance constraints make it increasingly difficult to meet the current CDM levels as the technologies continue to shrink and the circuit.