intel atom lpc issue
intel atom lpc issue

2018年4月13日—1.IntelidentifiedpossiblecircuitdesignissuesintheLPCbus,USB2.0LS/FSandSDCardlogicwhichmayresultindegradationoftheLPCbus ...,2018年4月11日—IntelidentifiedpossiblecircuitdesignissuesintheLPCbus,USB2.0LS/FSandSDCardlogicwhichmayresulti...

Intel Apollo Lake 可能面臨可靠性的問題或導致無法開機

2019年9月11日—在先前Intel因為AtomC2000被發現存在LPC時鐘元件缺陷的硬體瑕疵問題,導致當該處理器被使用達18個月後,其故障率會大幅度增加。原因是因為在Atom ...

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Another Atom Bomb Intel Atom E3800 Bay Trail VLI89 Bug

2018年4月13日 — 1. Intel identified possible circuit design issues in the LPC bus, USB2.0 LS/FS and SD Card logic which may result in degradation of the LPC bus ...

Atom Bay Trail dying because of LPC bus design flaw?

2018年4月11日 — Intel identified possible circuit design issues in the LPC bus, USB2.0 LS/FS and SD Card logic which may result in degradation of the LPC ...

Atom E38xx LPC, RTC, USB Failure Issue

2017年4月7日 — Our motherboard manufacturer initially believed the LPC_CLKRUN# BIOS workaround fixed all but now understand it has no effect on RTC, SD and USB ...

Intel Apollo Lake 可能面臨可靠性的問題或導致無法開機

2019年9月11日 — 在先前Intel 因為Atom C2000 被發現存在LPC 時鐘元件缺陷的硬體瑕疵問題,導致當該處理器被使用達18 個月後,其故障率會大幅度增加。原因是因為在Atom ...

Intel Atom C2000 Failures

2017年9月27日 — Intel's errata noted that this issue doesn't occur if LPC is 1.8V which suggests the lower power reduces degradation. The strong pull down ...

Intel Atom C2xxx LPC failures

2017年2月5日 — I've got a ASA5506, SG-2220, 2 x SG-2440 and a SG-4860. Can't wait to hear about that workaround. Would love to learn how pfSense/ADI are ...

Intel redesigns flawed Atom CPUs to stave off premature ...

2017年4月27日 — Version C0 fixes problems with the chip's low pin count (LPC) bus clock outputs, and introduces a new specification for the LPC interface.

Intel Updates Apollo Lake

2019年9月9日 — More famously, Intel suffered a major circuit degradation problem with their entire Atom C2000 SoC line which has forced companies such as Cisco ...

Semi

2017年2月8日 — As quoted by The Register, Intel is saying that the problem is a degradation of a circuit element under high use conditions at a rate higher ...


intelatomlpcissue

2018年4月13日—1.IntelidentifiedpossiblecircuitdesignissuesintheLPCbus,USB2.0LS/FSandSDCardlogicwhichmayresultindegradationoftheLPCbus ...,2018年4月11日—IntelidentifiedpossiblecircuitdesignissuesintheLPCbus,USB2.0LS/FSandSDCardlogicwhichmayresultindegradationoftheLPC ...,2017年4月7日—OurmotherboardmanufacturerinitiallybelievedtheLPC_CLKRUN#BIOSworkaroundfixedallbutnowunderstandithasnoeffectonRT...